Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

• Tipo: Artigo em Revista Científica Internacional
• Data: 2003

Autores

Boerasu, I (Autor) Outra; Pereira, M (Autor) Outra; Vasilevskiy, M (Autor) Outra; Gomes, MJM (Autor) Outra; Watts, B (Autor) Outra; Leccabue, F (Autor) Outra; Vilarinho, PM (Autor) Outra

Revista

Título: Applied Surface Science

Vol. 208

Páginas: 604-610

ISSN: 0169-4332

Editora: Elsevier

Indexação

ISI Web of Knowledge - 6 Citações

Scopus - 7 Citações

Outras Informações

ID Authenticus: P-000-HCE

DOI: 10.1016/s0169-4332(02)01400-9

Abstract (EN): According to the general formula Pb1-x/2(Zr0.65Ti0.35)(1-x) Nb-x O-3 + 4 mol% PbO excess (X = 1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(1 0 0) substrates using either a Nd:YAG (355 nm) or a XeCl (308 nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 7