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Depth Reconstruction Based on Irregular Patches

Title
Depth Reconstruction Based on Irregular Patches
Type
Article in International Conference Proceedings Book
Year
2000
Authors
Kees van Overveld
(Author)
Other
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Piotr Wilinski
(Author)
Other
The person does not belong to the institution. The person does not belong to the institution. The person does not belong to the institution. Without AUTHENTICUS Without ORCID
Conference proceedings National
9º Encontro Portugues de Computação Gráfica
Marinha Grande, 16 - FEVEREIRO - 2000
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
Other information
Language: Portuguese
Type (Professor's evaluation): Scientific
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