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IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings
Title
IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings
Type
International Conference Proceedings Book
Year
2006
Conference International
International Conference on Design and Test of Integrated Systems in Nanoscale Technology
Tunis, TUNISIA, SEP 05-07, 2006
Other information
Language:
English
Type (Professor's evaluation):
Scientific
ISBN:
0-7803-9726-6
Documents
We could not find any documents associated to the publication.
Publications included
Article in International Conference Proceedings Book
José Machado da Silva (Author) (FEUP)
2006
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