Electronics 1

Code:

EEC0014

Acronym:

ELEC1

Keywords
Classification	Keyword
OFICIAL	Electronics and Digital Systems

Instance: 2017/2018 - 2S

Active?	Yes
Responsible unit:	Department of Electrical and Computer Engineering
Course/CS Responsible:	Master in Electrical and Computers Engineering

Cycles of Study/Courses

Acronym	No. of Students	Study Plan	Curricular Years	Credits UCN	Credits ECTS	Contact hours	Total Time
MIEEC	323	Syllabus	2	-	6	56	162

Teaching language

Portuguese

Objectives

This course aims to endow students with solid knowledge (CDIO Syllabus 1.1, 1.2 and 1.3) on:

• Application of laws and fundamental principles of circuit theory. 
• Operation of simple RC circuits and response to sinusoidal and square waves. 
• Linear-amplifier models and calculation of voltage and current gains, input and output resistance.
• Principles of p-n junction, junction diodes, bipolar and field effect transistors.
• Simple rectifier circuits.
• Biasing of electronic devices and equivalent models for small signal. 
• Separation between AC and DC circuit operation. 
• Common source (emitter), common drain (Collector) and common gate (base) circuits.

This course also aims to develop students’ personal and professional skills concerning engineering reasoning and problem solving (CDIO Syllabus 2.1- from 2.1.1 to 2.1.4), and be able to carry out experimentation (CDIO 2.2) and develop systemic thinking.

Learning outcomes and competences

This curricular unit is the first in the domain of analysis and conception of electronic circuits. The main goal is then to provide the students with the basic concepts and techniques in this domain. Therefore, the curriculum begins by system-analysis methods for first-order systems, important for the understanding and analysis of amplifier dynamics. The Opamp emerges as the first practical example. This first block aims to contextualize the content of the unit and presents the tools needed to analyse electronic circuits. Next, the fundamental electronic devices (diodes, bipolar and field-effect transistors) and its lumped models are studied. Finally, the basic topologies of amplification, which will serve as building blocks for electronic circuits, are analysed.

Working method

Presencial

Pre-requirements (prior knowledge) and co-requirements (common knowledge)

Circuit analysis

Program

1. Introduction      

1.1.   Brief historical overview of electronics
1.2.   The concept of electrical signal
1.3.   Signal amplitude and frequency. Filtering and amplitude and frequency modulation
1.4.   Signal coding
1.5.   Discretising and digitising electrical signals. Signal coding
1.6.   Linear amps
1.7.   Topics required for analysis and synthesis of electronic signals                             

1. Selected topics on circuit analysis

2.1.   Electrical circuits and electrical circuit components

2.1.1.Kirchhoff laws and circuit calculations
2.1.2.Laplace domain impedances. Impedance association

2.2.   Other electric circuit theorems

2.2.1.Superposition theorem
2.2.2.Thévenin and Norton theorems
2.2.3.Source absorption theorem
2.2.4.Miller's theorem

2.3.   Two port linear networks

2.3.1.hh parameters
2.3.2.yy parameters
2.3.3.Relation between hh and yy parameters

2.4.   Methods for linear circuit analysis

2.4.1.Nodal equations
2.4.2.Other methods                             

1. Time and frequency domain circuit response

3.1.   Frequency domain response: Bode diagrams

3.1.1.General considerations on transfer functions
3.1.2.Simplified Bode diagram design
3.1.3.Relation between amplitude and phase

3.2.   Time domain response of RC circuits

3.2.1.High-pass RC circuit
3.2.2.Low-pass RC circuit
3.2.3.Attenuators                              

1. Operational Amplifiers (OpAmps)                

4.1.   Inverting and non-inverting configurations
4.2.   Adder amplifier
4.3.   Integrator and differentiator circuits
4.4.   Difference amplifier: differential and common mode gain
4.5.   OpAmp limitations

4.5.1.Finite and frequency dependent gain
4.5.2.Non-ideal input resistance

4.6.   Other OpAmp limitations

4.6.1.Maximum voltage: saturation
4.6.2.Maximum current: slew rate

4.7.   DC voltage and current

4.7.1.Input current and current offset
4.7.2.Input voltage offset                         

1. Introduction to semiconductors

5.1.   Si doping
5.2.   Quantic interpretation and band theory
5.3.   Carrier drift and diffusion
5.4.   Einstein equation
5.5.   PN junction in open circuit and reverse biased

5.5.1.Junction capacitance
5.5.2.Breakdown mechanisms in a reverse biased junction

5.6.   Direct biased PN junction

5.6.1.Diffusion capacitance                            

1. Diodes and diode circuits

6.1.   Conducting conditions in a junction diode

6.1.1.Biasing and signal
6.1.2.Temperature dependence of diode parameters
6.1.3.Several approximation level to the diode characteristics

6.2.   Different scales for diode conduction analysis: piecewise linear approximation
6.3.   Half-wave rectifier and filtered rectification
6.4.   Full-wave rectifiers
6.5.   The Zener diode and zener characteristics

6.5.1.Stabilised power supplies with zener diodes
6.5.2.Ideal and real zener diodes

6.6.   Diode based clipping and clamping circuits
6.7.   Voltage multipliers: the Cockcroft & Walton generator                              

1. Field effect transistors (FET)           

7.1.   Introduction
7.2.   Junction field effect transistor (JFET)
7.3.   The MOSFET
7.4.   Enhancement MOSFET

7.4.1. Qualitative and quantitative analysis of the iD(vGS) characteristic
7.4.2. iD(vGS) in saturation
7.4.3. MOSFET characteristics in weak
inversion
7.4.4. p-channel MOSFET and complementary MOSFET (CMOS)

7.5.   Depletion MOSFET

7.5.1.Channel length modulation. MOSFET model in saturation
7.5.2.MOSFET biasing: voltage and current calculation
7.5.3. Body-effect. Π-model with body effect.

7.6.   Basic MOSFET circuits

7.6.1.Common source configuration
7.6.2.Common source configuration with source resistor
7.6.3.Common drain configuration
7.6.4.Common gate configuration                            

1. Bipolar junction transistors (BJT)    

8.1.   Internal structure and physical operation of the BJT: first considerations about basic BJT circuits

8.2.   Working conditions of the BJT

8.2.1.Charge distribution and collector current in the active mode
8.2.2.Other modes of operation of the BJT
8.2.3. Voltage/current characteristics
8.2.4. Base width modulation (Early effect): ro

8.3.   Small signal models of the bipolar transistor: π and T models
8.4.   The parameter ß and the hh parameters
8.5.   The BJT in saturation
8.6.   Breakdown in BJT transistors
8.7.   Basic circuits with bipolar junction transistors

8.7.1.Common emitter configuration
8.7.2.Common emitter configuration with emitter resistor
8.7.3.Common collector configuration
8.7.4.Common base configuration

 

Mandatory literature

Pedro Guedes de Oliveira / Dinis Magalhães Santos; Apontamento de Eletrónica (This document is in Portuguese )
Adel S. Sedra, Kenneth C. Smith; Microelectronic circuits. ISBN: 978-0-19-973851-9

Teaching methods and learning activities

During lectures the subjects are presented and discussed with illustrative practical examples, interspersed with tutoring lessons used for demonstration of analysis techniques and synthesis of circuits. The lectures focuses more on deepen the knowledge and subject illustration than on an exhaustive presentation of all subjects. The relevant matters of the unit correspond to what is described in the notes "Apontamentos de Eltrónica", available to students through moodle. These are complemented by "Microelectronic Circuits" of Sedra & Smith.

In lab lessons a number of experimental activities will be carried out, using basic electronic components and their application in circuits, its assembly and test. Lab assignment guides are available in advance on the course webpage. Each lab activity is structure into four components:

1. A component where the subjects related to the lab work are presented.
2. A component where the lab activity is taken autonomously, at a predefined time and place, during which the students will develop the experimental work assignment,with the help of the technical staff. 
3. During part the following lab class the students will have the opportunity to demonstrate their work and discuss questions and difficulties they might have had during the autonomous class.
4. One question quiz is to be answered by the elements of the group, related to the lab assignment.

Usually, during lab-classes, with the presence of the professor, the order of activity is 3, 4, 1, being the last dedicated to the next lab assignment 

Software

MultiSim - National Instruments

keywords

Technological sciences > Engineering > Electronic engineering
Technological sciences > Engineering > Electrical engineering

Evaluation Type

Distributed evaluation with final exam

Assessment Components

Designation	Weight (%)
Exame	50,00
Teste	20,00
Trabalho laboratorial	30,00
Total:	100,00

Amount of time allocated to each course unit

Designation	Time (hours)
Estudo autónomo	76,50
Frequência das aulas	54,00
Trabalho laboratorial	26,00
Total:	156,50

Eligibility for exams

• Attendance of lab classes is mandatory. The number of permitted absences from lab class is very limited and follows University rules.

• If a student skips an assignment, even if adequately justified, the student still have to perform that assignment during another lab class or during extra-curricular time. However, students have to be authorized by the professor and supervised by the laboratory responsible.

• Students can only attend the exam if a minimum grade of 8 out of 20 is acheived in the laboratory-class component.

 

Calculation formula of final grade

 

Examinations or Special Assignments

1. Two midterms along the semester. Typically the first between the 5th and the 6th week and the second between the 9th and 10th week of the semester. They weight 10% each on the final mark.


2. Students will be assessed on their performance and participation in laboratory classes, by their effort and engagement (30%) as well as by answering to a quiz at the end of each assignment (70%). Labs will be available for two more hours per week (besides the regular class time), so that students can develop their assignments autonomously.

Internship work/project

Does not apply.

Special assessment (TE, DA, ...)

1. Lab component is mandatory for all students.


2. Special regime students are exempt from performing midterms. However they can request to perform them.


3. The weights on the final grade for the different components is as described above:




1. Lab component – 30%


2. Each midterm – 10%


3. Final exam – between 50% and 70%, depending on the attendance to the midterms.

In all cases, the lab-component grade (in a 0 to 20 scale) is limited to the final exam grade plus 4 points (out of 20)

Classification improvement

1. The lab component grade is kept for both final exam periods, either for the regular or the second period of exams.


2. In case of registering to a final exam for grade improvement, if in the same school year, the same rules apply to the second period of final exams as for the first; if in a subsequent school year, the exam will weight 70% and the lab grade, already taken, weights 30%

In all cases, the lab-component grade (in a 0 to 20 scale) is limited to the final exam grade plus 4 points (out of 20)

NOTE: Omitted situations will be analysed case by case.