Characterisation of modified sputtered (TiAI)-based intermetallic materials doped with silver and chromium

• Tipo: Artigo em Revista Científica Internacional
• Data: 2000

Autores

C. Coelho (Autor) Outra; A. S. Ramos (Autor) Outra; B. Trindade (Autor) Outra; M. T. Vieira (Autor) Outra; J. V. Fernandes (Autor) Outra; Manuel Fernando Gonçalves Vieira (Autor) FEUP

Revista

Título: Key Engineering Materials

Vol. 188

Páginas: 37-44

ISSN: 1013-9826

Editora: Trans Tech Publications Ltd

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Engenharia dos materiais

CORDIS: Ciências Tecnológicas > Engenharia > Engenharia de materiais

Outras Informações

Abstract (EN): TiAl-M (M = Ag, Cr) thin films were synthesised by sputtering and heat-treated in order to obtain the γ-TiAl phase. The results showed that the addition of silver or chromium does not lead to a significant improvement of the mechanical properties of the γ-TiAl structure. However, structural results obtained from similar materials produced by foundry confirm that sputtering might be used as a screening technique, in order to give helpful information for the future production of better performance bulk (titanium aluminide)-based materials. © 2000 Trans Tech Publications, Switzerland.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 8