A Methodology Development for the Study of Near Surface Stress Gradients

• Tipo: Artigo em Revista Científica Internacional
• Data: 2000

Autores

Maria José Marques (Autor) FEUP; A. M. Dias (Autor) Outra; P. Gergaud (Autor) Outra; J. L. Lebrun (Autor) Outra

Revista

Título: Materials Science and Engineering A

Vol. 287 Nº 1

Páginas: 78-86

ISSN: 0921-5093

Editora: Elsevier Science

Indexação

ISI Web of Science

Scopus

COMPENDEX

INSPEC

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Outras ciências da engenharia e tecnologias

Outras Informações

Abstract (EN): A modification of the geometry used in the sin2c technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted Fij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film. © 2000 Elsevier Science S.A. All rights reserved.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 9