Structural and optical studies of CdS nanocrystals embedded in silicon dioxide films

• Tipo: Artigo em Revista Científica Internacional
• Data: 1998

Autores

Rolo, AG (Autor) Outra; Conde, O (Autor) Outra; Gomes, MJM (Autor) Outra

Revista

Título: Thin Solid Films

Vol. 318

Páginas: 108-112

ISSN: 0040-6090

Editora: Elsevier

Indexação

ISI Web of Knowledge - 25 Citações

Scopus - 28 Citações

Outras Informações

ID Authenticus: P-001-83Z

DOI: 10.1016/s0040-6090(97)01175-9

Abstract (EN): Silicon dioxide films doped with nanocrystallites of CdS with a mean radius value in the range of 20 to 40 Angstrom have been grown using the magnetron rf-sputtering technique. We have studied the combined effects of rf-power deposition, the number of semiconductor chips on the SiO2 target, and post-annealing temperature on the CdS crystal size. The optical transmission spectra display a marked blue shift of the absorption band edge of up to 400 meV which was attributed to quantum size confinement effects. The luminescence spectra show a narrow emission peak tentatively explained as being due to the recombination of electrons on shallow donor levels with confined valence band holes. (C) 1998 Elsevier Science S.A.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 5