Dos mesmos autores
Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice (2012)
Artigo em Revista Científica Internacional
Vieira, EMF; Martin Sanchez, J; Rolo, AG; Parisini, A; Buljan, M; Capan, I; Alves, E; Barradas, NP; Conde, O; Bernstorff, S; Chahboun, A; Levichev, S; Gomes, MJM
Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix (2011)
Artigo em Revista Científica Internacional
Vieira, EMF; Pinto, SRC; Levichev, S; Rolo, AG; Chahboun, A; Buljan, M; Barradas, NP; Alves, E; Bernstorff, S; Conde, O; Gomes, MJM
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