Probing the exciton density of states in semiconductor nanocrystals using integrated photoluminescence spectroscopy

• Tipo: Artigo em Revista Científica Internacional
• Data: 2002

Autores

Filonovich, SA (Autor) Outra; Rakovich, YP (Autor) Outra; Vasilevskiy, MI (Autor) Outra; Artemyev, MV (Autor) Outra; Talapin, DV (Autor) Outra; Rogach, AL (Autor) Outra; Rolo, AG (Autor) Outra; Gomes, MJM (Autor) Outra

Revista

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Título: MONATSHEFTE FUR CHEMIE

Vol. 133

Páginas: 909-918

ISSN: 0026-9247

Indexação

ISI Web of Knowledge - 9 Citações

Scopus - 10 Citações

Outras Informações

ID Authenticus: P-000-P88

DOI: 10.1007/s007060200061

Abstract (EN): We present the results of a comparative analysis of the absorption and photoluminescence excitation (PLE) spectra vs. integrated photoluminescence (IPL) measured as a function of the excitation wavelength for a number of samples containing II-VI semiconductor nanocrystals (NCs) produced by different techniques. The structure of the absorption and PL spectra due to excitons confined in NCs and difficulties with the correct interpretation of the transmittance and PLE results are discussed. It is shown that, compared to the conventional PLE, the IPL intensity plotted against the excitation wavelength (EPLE spectra) reproduce better the structure of the absorption spectra. Therefore, IPLE spectroscopy can be successfully used for probing the quantized electron-hole (e-h) transitions in semiconductor nanocrystals.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 10