Electronic Systems

Code:

EEC0152

Acronym:

SELE

Keywords
Classification	Keyword
OFICIAL	Automation, Control & Manufacturing Syst.
OFICIAL	Electronics and Digital Systems

Instance: 2016/2017 - 1S

Active?	Yes
Web Page:	http://moodle.up.pt/course/view.php?id=2709
Responsible unit:	Department of Electrical and Computer Engineering
Course/CS Responsible:	Master in Electrical and Computers Engineering

Cycles of Study/Courses

Acronym	No. of Students	Study Plan	Curricular Years	Credits UCN	Credits ECTS	Contact hours	Total Time
MIEEC	20	Syllabus	5	-	6	56	162

Teaching language

English

Objectives

Objectives: Empower students with the competences required to design, implemet, and test microcontroller based systems making use of standard communication and testing technologies.

Learning outcomes and competences

Non-technical skills: Teamwork; Communication.
Non-technical learning outcomes: The students shall be able to collaborate in the development of technical projects and in the production of the corresponding technical reports and presentations.

Technical skills: Conceiving and engineering of electronic systems; Designing; Implementation.

Technical learning outcomes envisaged for part 1:  At the end of this part the students shall be able to: a) Describe the IEEE 1149.1 test bus protocol and develop test programs based on this bus and its derivatives 1149.x; b) Explain how to detect structural faults (shorts and opens) at printed circuit level; c) Develop test programs to detect structural faults on printed circuit boards using BST.

Technical learning outcomes envisaged for part 2: At the end of this part the students shall be able to: a) Describe the I2C, SPI and OneWire bus protocols and their operation; b) Explain the operation of selected peripheral devices that use these communication buses.

Technical learning outcomes envisaged for part 3: At the end of this part students shall be able to a) Conceive, implement and debug a microcontroller based electronic system; b) Use fast prototyping methodologies and "design for manufacturability" and "design for testability" methodologies.

Working method

Presencial

Pre-requirements (prior knowledge) and co-requirements (common knowledge)

It is assumed that students have previous knowledge on microprocessor based systems as well as on digital and analogue electronic circuits. Lack of previous technical skills in these areas should be addressed at the students responsability.

Program

Part 1:
- General concepts on test and design for testability of eletronic circuits
- The IEEE 1149.x test buses protocol and operation
- Structural fault detection in 1149.1 compliant printed circuit boards
- Test of memories
- Test program development for analog and digital circuits

Part 2:
- Serial communication buses: I2C, SPI, OneWire
- Selected serial access devices and peripherals: memories, RTC, IO expanders, sensors, ...
 
Part 3:
- Systemic approach to the design of microcontroller based systems
- Robust programming and high level symbolic debugging
- Fast prototyping, hardware/software codesign methodologies.

Mandatory literature

Michael L. Bushnell, Vishwani D. Agrawal; Essentials of electronic testing for digital memory and mixed-signal VLSI circuits. ISBN: 0-7923-7991-8

Complementary Bibliography

ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen; VLSI test principles and architectures. ISBN: 9780080474793 (eISBN)

Comments from the literature

All learning and technical contents will be made available in the UP moodle server.

Teaching methods and learning activities

This course resorts to active and collaborative learning techniques, which lead students to solve theoretical and lab assignments. Emphasis will be placed on hands-on lab activities: 4 out of 12 sessions will be dedicated to the development of a project.

Software

Eagle CAD
Ambiente de desenvolvimento ATMEL, MICROCHIP ou TEXAS INSTRUMENTS

keywords

Technological sciences > Engineering > Electrical engineering
Technological sciences > Technology > Micro-technology > Subsystem modules
Technological sciences > Technology > Micro-technology > Microsystems
Technological sciences > Engineering > Electronic engineering

Evaluation Type

Distributed evaluation with final exam

Assessment Components

Designation	Weight (%)
Exame	40,00
Trabalho laboratorial	60,00
Total:	100,00

Amount of time allocated to each course unit

Designation	Time (hours)
Elaboração de projeto	36,00
Estudo autónomo	70,00
Frequência das aulas	56,00
Total:	162,00

Eligibility for exams

Attendance of a minimum of 75 % of the regular class hours foreseen for the full semester.

Calculation formula of final grade

The final mark will follow the equation:

0,5xP + 0,1xR  + 0,1xLW + 0,4xEF

P: Projet
R: Report
EF: Final exam
LW: Lab work

Examinations or Special Assignments

One laboratory assignment, based on a minimal set of specifications, covering all the topics of the course.

Special assessment (TE, DA, ...)

Written (or oral) exam and/or development of a lab assignement.

Classification improvement

Written (or oral) exam and/or development of a lab assignement.