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THERMAL STABILITY OF ENERGY-EMISSION FROM CdTe NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS

Title
THERMAL STABILITY OF ENERGY-EMISSION FROM CdTe NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS
Type
Article in International Scientific Journal
Year
2010
Authors
Levichev, S
(Author)
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Chahboun, A
(Author)
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Rolo, AG
(Author)
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Conde, O
(Author)
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Gomes, MJM
(Author)
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Journal
Vol. 24
Pages: 2837-2843
ISSN: 0217-9849
Publisher: World Scientific
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Publicação em ISI Web of Knowledge ISI Web of Knowledge - 0 Citations
Publicação em Scopus Scopus - 0 Citations
Other information
Authenticus ID: P-003-0XZ
Abstract (EN): CdTe-doped SiO2 thin films were produced by RF magnetron co-sputtering technique. Presence of CdTe nanocrystals inside the silica matrix was confirmed by Raman spectroscopy and grazing incidence X-ray diffraction. The samples demonstrate size dependent photoluminescence. Temperature dependent photoluminescence measurements were carried out in the temperature range 15-295 K and revealed energy-emission thermal stability. This feature can be usefully applied in a production of light-emitting diodes with wavelength stability in a wide temperature range.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 7
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