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Nanoscale stereometric evaluation of BiZn0.5Ti0.5O3 thin films grown by RF magnetron sputtering

Title
Nanoscale stereometric evaluation of BiZn0.5Ti0.5O3 thin films grown by RF magnetron sputtering
Type
Article in International Scientific Journal
Year
2020
Authors
Barcelay, YR
(Author)
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Agostinho Moreira, JA
(Author)
FCUP
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Almeida, ADM
(Author)
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Brito, WR
(Author)
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Matos, RS
(Author)
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Filho, HD
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Journal
Title: Materials LettersImported from Authenticus Search for Journal Publications
Vol. 279
ISSN: 0167-577X
Publisher: Elsevier
Other information
Authenticus ID: P-00S-JZ6
Abstract (EN): Sputtered BiZn0.5Ti0.5O3 thin films were synthesized and analyzed. The structure and morphology of BZT350, BZT600, and BZT700 were studied by XRD, SEM, and AFM. BZT600 and BZT700 exhibited crystalline nature, while BZT350 exhibited amorphous structure. Furthermore, BZT600 and BZT700 displayed grains size of similar to 33 and similar to 328 nm, respectively. Stereometric analysis revealed that the nanoscale morphology of all films had conical nanopeaks, with BZT600 having greater roughness (similar to 9.6 nm). BZT600 presented the highest S-k and V-mp values in addition to greater asymmetry and less flat behavior. Additionally, functional, spatial, and hybrid parameters revealed that BZT600 was more irregular and less isotropic. Power spectrum density (PSD) and slices suggested that the nanotexture of BZT600 has greater potential for capturing energy in solar cells. These materials can be of great interest for the fabrication of new photovoltaic or energy storage devices.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 5
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