Structural and optical properties of Ge nanocrystals embedded in Al2O3

• Type: Article in International Scientific Journal
• Date: 2008

Authors

Caldelas, P (Author) Other; Rolo, AG (Author) Other; Chahboun, A (Author) Other; Foss, S (Author) Other; Levichev, S (Author) Other; Finstad, TG (Author) Other; Gomes, MJM (Author) Other; Conde, O (Author) Other

Journal

Title: Journal of Nanoscience and Nanotechnology

Vol. 8 No. 8

Pages: 572-576

ISSN: 1533-4880

Publisher: American Scientific Publishers

Indexing

ISI Web of Knowledge - 5 Citations

Scopus - 8 Citations

Other information

Authenticus ID: P-004-1V9

DOI: 10.1166/jnn.2008.a186

Abstract (EN): Ge nanocrystals (NCs) embedded in aluminum oxide were grown by RF-magnetron sputtering. Raman, high resolution transmission electron microscopy (HRTEM), selected area diffraction (SAD), and X-ray diffraction (XRD) techniques confirmed good cristallinity of the NCs from samples annealed at 800 degrees C. The average NC size was estimated to be around 7 nm. Photoluminescence (PL) measurements show an emission related to the NCs. The temperature dependence of the PL confirms the confinement phenomenon in the Ge NCs.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 5