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High-Level Test Specification and Planning for Mixed-Signal Boards with Boundary-Scan

Title
High-Level Test Specification and Planning for Mixed-Signal Boards with Boundary-Scan
Type
Article in International Conference Proceedings Book
Year
1997
Authors
Ana Leão
(Author)
Other
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José Machado da Silva
(Author)
FEUP
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José Silva Matos
(Author)
FEUP
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Conference proceedings International
Pages: 33-37
DCIS'97 - XII Conference on Design of Circuits and Integrated Systems
Escuela Superior de Ingenieros, Universidad de Sevilla, Sevilha, Espanha
Other information
Language: Portuguese
Type (Professor's evaluation): Scientific
No. of pages: 5
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