Accurate subpixel corner detection on planar camera calibration targets

• Tipo: Artigo em Revista Científica Internacional
• Data: 2007

Autores

da Silva Tavares, PJ (Autor) Outra; Mário Vaz (Autor) FEUP

Revista

Título: Optical Engineering

Vol. 46 Nº 10

Páginas: 1072051-107205

ISSN: 0091-3286

Editora: SPIE

Indexação

ISI Web of Knowledge - 5 Citações

Scopus - 14 Citações

Classificação Científica

CORDIS: Ciências Tecnológicas > Tecnologia > Optoelectrónica

Outras Informações

ID Authenticus: P-004-7AP

DOI: 10.1117/1.2790926

Abstract (EN): Feature detectors have long been one of the touchstones of image processing. Most vision tasks are entirely dependent on the accurate determination of fiducial marks on images, which ultimately led to a quest for methods able to detect feature locations with high resolution. We report the development of an intensity-based subpixel corner detector based on the two-dimensional (2-D) Hilbert transform. Extensive testing of both accuracy and precision with live images finds the method adequate for subpixel detection at better than 10(-1) pixel accuracy. The subpixel corner detectors and the evaluation proposals to date are briefly reviewed, and the proposed method is described. The results are shown and discussed. (c) 2007 Society of Photo-Optical Instrumentation Engineers.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 8