Secondary scintillation yield in pure xenon

• Tipo: Artigo em Revista Científica Internacional
• Data: 2007

Autores

Monteiro, CMB (Autor) Outra; Fernandes, LMP (Autor) Outra; Lopes, JAM (Autor) Outra; Coelho, LCC (Autor) Outra; Veloso, JFCA (Autor) Outra; dos Santos, JMF (Autor) Outra; Giboni, K (Autor) Outra; Aprile, E (Autor) Outra

Revista

Título: Journal of Instrumentation

Vol. 2

ISSN: 1748-0221

Editora: Institute of Physics Publishing

Indexação

ISI Web of Knowledge - 67 Citações

Outras Informações

ID Authenticus: P-004-AC2

DOI: 10.1088/1748-0221/2/05/p05001

Abstract (EN): The xenon secondary scintillation yield was studied as a function of the electric field in the scintillation region, in a gas proportional scintillation counter operated at room temperature. A large area avalanche photodiode was used for the readout of the VUV secondary scintillation produced in the gas, together with the 5.9 keV x-rays directly absorbed in the photodiode. The latter was used as a reference for the determination of the number of charge carriers produced by the scintillation pulse and, thus, the number of VUV photons impinging the photodiode. A value of 140 photons/kV was obtained for the scintillation amplification parameter. The attained results are in good agreement with those predicted, for room temperature, by Monte Carlo simulation and Boltzmann calculations, as well as with those obtained for saturated xenon vapour, at cryogenic temperatures, and are about a factor of two higher than former results measured at room temperature.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 11