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Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)

Title
Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)
Type
International Conference Proceedings Book
Year
2006
Conference International
21st IEEE International Symposium on Defect. and Fault Tolerance in VLSI Systems (DFT 06)
Arlington/Washington DC, EUA, 4 a 6 de Outubro de 2006
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
Other information
Language: English
Type (Professor's evaluation): Scientific
ISBN: 0-7695-2706-X
Documents
We could not find any documents associated to the publication.
Publications included
Real time fault injection using enhanced OCD - a performance analysis
Article in International Conference Proceedings Book
André V. Fidalgo (Author) (Other); Gustavo R. Alves (Author) (Other); José M. Ferreira (Author) (FEUP)
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