Real time fault injection using enhanced OCD - a performance analysis

• Type: Article in International Conference Proceedings Book
• Date: 2006

Authors

André V. Fidalgo (Author) Other; Gustavo R. Alves (Author) Other; José M. Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)

21st IEEE International Symposium on Defect. and Fault Tolerance in VLSI Systems (DFT 06)

Arlington/Washington DC, EUA, 4 a 6 de Outubro de 2006

Indexing

ISI Proceedings

ISI Web of Science

Scopus

INSPEC

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

DOI: 10.1109/DFT.2006.51

Abstract (EN): Fault injection is frequently used for the verification and validation of dependable systems. When targeting real time microprocessor based systems the process becomes significantly more complex. This paper proposes two complementary solutions to improve real time fault injection campaign execution, both in terms of performance and capabilities. The methodology is based on the use of the on-chip debug mechanisms present in modern electronic devices. The main objective is the injection of faults in microprocessor memory elements with minimum delay and intrusiveness. Different configurations were implemented and compared in terms of performance gain and logic overhead.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 9