Microstructural characterisation of y-TiAl joints

• Tipo: Artigo em Revista Científica Internacional
• Data: 2002

Autores

Guedes, A (Autor) Outra; Pinto, AMP (Autor) Outra; Vieira, M (Autor) FEUP; Viana, F (Autor) FEUP; Ramos, AS (Autor) Outra; Vieira, MT (Autor) Outra

Revista

Título: Advanced Materials Forum I

Vol. 587-588

Páginas: 27-30

Editora: Trans Tech Publications

Indexação

ISI Web of Knowledge - 7 Citações

Scopus - 9 Citações

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Engenharia dos materiais

Outras Informações

ID Authenticus: P-000-QNH

DOI: 10.4028/www.scientific.net/kem.230-232.27

Abstract (EN): The joining of a gamma-TiAl alloy using Incusil-ABA as filler metal was investigated. Bonding was performed in a high vacuum furnace at 750 degreesC for 10 min. The interfacial microstructure was analysed by SEM and its composition was investigated by EDS. An intense diffusion of Ti and Al to the interface and a strong reaction between the braze alloy and the base metal were observed. The interface could be divided into two distinct zones: (1) the reaction layer located near the base metal, essentially composed of Cu-Al-Ti compounds and (2) the central zone of the interface that corresponds to an (Ag) solid solution in which Cu-Al-Ti compounds are dispersed.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 4