New temperature scan method (TSM) for revealing the chiral smectic polar phases

• Tipo: Artigo em Revista Científica Internacional
• Data: 1996

Autores

Carvalho, PS (Autor) FCUP; Glogarova, M (Autor) Outra; Chaves, MR (Autor) FCUP; Destrade, C (Autor) Outra; Nguyen, HT (Autor) Outra

Revista

Título: Liquid Crystals

Vol. 21

Páginas: 115-119

ISSN: 0267-8292

Editora: Taylor & Francis

Indexação

ISI Web of Knowledge - 9 Citações

Scopus - 9 Citações

Classificação Científica

FOS: Ciências exactas e naturais > Química

Outras Informações

ID Authenticus: P-001-E30

DOI: 10.1080/02678299608033801

Abstract (EN): A new simple and reliable method to identify the antiferro-, ferri- and ferro-electric and the S-C alpha* phases has been worked out, involving temperature scanning of the liquid crystalline sample under a square wave electric field. The d.c. current recorded during the temperature run provides information about the phases and the phase transition temperatures. The resolution power of the method is checked by the study of three compounds. The results obtained by this new Temperature Scan Method (TSM) are compared to those found from dielectric measurements and from the study of the optical and dielectric hysteresis loops.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 5