Functional in-circuit characterisation of Sigma Delta modulators

• Tipo: Artigo em Revista Científica Internacional
• Data: 2002

Autores

José Alfredo Ribeiro da Silva Matos (Autor) FEUP; José Alberto Peixoto Machado da Silva (Autor) FEUP; Jorge Duarte (Autor) Outra

Revista

Título: Measurement: Journal of the International Measurement Confederation

Vol. 32 Nº 4

Páginas: 257-264

ISSN: 0263-2241

Editora: Elsevier

Indexação

ISI Web of Knowledge - 1 Citação

Scopus - 1 Citação

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Engenharia electrotécnica, electrónica e informática

CORDIS: Ciências Tecnológicas > Engenharia > Engenharia electrónica

Outras Informações

ID Authenticus: P-000-M9G

DOI: 10.1016/s0263-2241(02)00031-3

Abstract (EN): A method for the in-circuit functional testing of SigmaDelta modulators is described which can be built in large integrated circuits or systems-on-chip. It allows for measuring gain and phase, as well as total harmonic distortion and signal to noise and harmonic distortion ratio parameters. This method can be built in-circuit using existing computational resources, such as digital signal processors or (re)configurable logic, which can therefore be used to implement both mission and test operations. Both simulation and experimental results were obtained which are in close agreement with those expected from the theory.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 8