Dynamically rotate and free for test: the aath for FPGA concurrent test

• Type: Article in International Conference Proceedings Book
• Date: 2001

Authors

Manuel Gericota (Author) Other; Gustavo Costa Alves (Author) Other; José Martins Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the 2nd Latin America Test Workshop LATW'01

Pages: 180-185

2nd Latin America Test Workshop LATW¿01

Cancun, México, 11 a 14 de Fevereiro de 2001

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences > Engineering > Electrical engineering

Other information

Abstract (EN): Dynamically reconfigurable systems have benefited from a new class of FPGAs, recently introduced into the market, that enables partial and dynamic reconfiguration. While enabling concurrent reconfiguration without disturbing the system operation, this technology also raises a new test challenge: to assure a continuously fault-free operation, independently of the circuit present after many reconfiguration processes. A new structural concurrent test method, recently proposed by the authors and based on the principle of replicating and freeing the resources to be tested, raised several questions, one of them being: what strategy to follow in the process of dynamically replicating and freeing those resources? This paper presents a strategy to free the resources to be tested and the results of a series of simulation experiments made with the objective of finding the best methodology to achieve it.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6