MEASUREMENT OF THERMAL EFFECTS IN MONOLITHIC VOLTAGE COMPARATORS

• Tipo: Artigo em Revista Científica Internacional
• Data: 1992

Autores

DOMINGUES, JPP (Autor) Outra; SIMOES, JBPS (Autor) Outra; CORREIA, CMBA (Autor) Outra

Revista

Título: Measurement Science and Technology

Vol. 3

Páginas: 1050-1053

ISSN: 0957-0233

Editora: Institute of Physics Publishing

Indexação

ISI Web of Knowledge - 0 Citações

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Outras Informações

ID Authenticus: P-001-P2J

DOI: 10.1088/0957-0233/3/11/005

Abstract (EN): The monolithic voltage comparator is reviewed, focusing on behaviour in the pulsed (dynamic) mode of operation. Special attention is dedicated to the influence of short term history of the inputs on the thermal offset. A method is presented and discussed that reveals and quantifies the thermal offset, with 25 muV resolution, by measuring a hysteresis introduced on the comparator dynamic transition curve. It is shown that the deviation in comparator output due to thermal imbalance of the input differential pair, can significantly affect the response of a 16 bit ADC (2 or 3 least significant bits in a 10 V input range).

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 4