HRTEM and GIXRD studies of CdS nanocrystals embedded in Al2O3 films produced by magnetron RF-sputtering

• Tipo: Artigo em Revista Científica Internacional
• Data: 2003

Autores

Conde, O (Autor) Outra; Rolo, AG (Autor) Outra; Gomes, MJM (Autor) Outra; Ricolleau, C (Autor) Outra; Barber, DJ (Autor) Outra

Revista

Título: Journal of Crystal Growth

Vol. 247

Páginas: 371-380

ISSN: 0022-0248

Editora: Elsevier

Indexação

ISI Web of Knowledge - 18 Citações

Scopus - 22 Citações

Outras Informações

ID Authenticus: P-000-K00

DOI: 10.1016/s0022-0248(02)01975-9

Abstract (EN): In this paper we report on the structural properties of as-grown CdS nanoparticles embedded in Al2O3 films produced by a magnetron RF-sputtering technique. Grazing incidence X-ray diffraction together with high-resolution transmission electron microscopy (HRTEM) and electron diffraction were used to study the crystallinity and morphology of the CdS nanocrystals. Depending on the deposition parameters, elongated or spherical nanocrystals were grown. HRTEM shows evidence of the growth of CdS nanocrystals at room temperature with sizes in the range of 3-8 nm, and indicates that the nanocrystals formed in the cubic phase during the early stages of the deposition process. Stress-free films were formed under selected deposition conditions.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 10