Optical properties study of PLZT films deposited on sapphire Substrate

• Tipo: Artigo em Revista Científica Internacional
• Data: 2008

Autores

Khodorov, A (Autor) Outra; Gomes, MJM (Autor) Outra

Revista

Título: Vacuum

Vol. 82

Páginas: 1495-1498

ISSN: 0042-207X

Editora: Elsevier

Indexação

ISI Web of Knowledge - 4 Citações

Scopus - 7 Citações

Outras Informações

ID Authenticus: P-003-X2R

DOI: 10.1016/j.vacuum.2008.03.006

Abstract (EN): Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on sapphire (0001) Substrate by sol-gel method. The cell parameters of films were calculated with help of whole-pattern fitting procedure. The evolution of strain, shift of absorption edge and change in the band tailing with film thickness were found and analyzed for amorphous and polycrystalline PUT films. The refractive index n was computed with help of "Envelope method" and dielectric function was calculated by fitting the measured optical transmission spectrum.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 4