Characterization of Nb-doped PZT (65/35/1) ferroelectric thin films deposited by pulsed laser ablation

• Tipo: Artigo em Revista Científica Internacional
• Data: 2008

Autores

Pereira, M (Autor) Outra; Boerasu, I (Autor) Outra; Gomes, MJM (Autor) Outra

Revista

Título: Vacuum

Vol. 82

Páginas: 1379-1382

ISSN: 0042-207X

Editora: Elsevier

Indexação

ISI Web of Knowledge - 1 Citação

Scopus - 1 Citação

Outras Informações

ID Authenticus: P-003-X29

DOI: 10.1016/j.vacuum.2008.03.036

Abstract (EN): Using ceramic targets prepared by conventional way, based on the composition Pb-0.995(Zr0.65Ti0.35)(0.99)Nb0.01O3 + 4% mole PbO excess (PZTN), several ferroelectric films were deposited by pulsed laser ablation (PLA) technique on Pt (111) coated Si and MgO (100) substrates, using XeCl (308 nm) excimer laser. X-ray diffraction is used to characterize the produced perovskite phase (rhombohedral phase) as well as to evaluate the secondary phases and to describe the structural changes during annealing. The optical characteristics are measured in the UV-vis-near IR region. Also, ferroelectric hysteresis behaviour has been characterized by CV measurements.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 4