Abstract (EN):
A test technique for capacitive MEMS
accelerometers and electrostatic micro-actuators based on
the measurement of pull-in voltages is described. A
combination of pull-in voltages and resonance frequency
measurements can be used for the estimation of processinduced
variations in device dimensions from layout and
deviations in material properties from nominal value,
which enables auto-calibration. Preliminary measurements
on fabricated devices confirm the validity of the proposed
technique. Moreover, long-term pull-in measurements have
indicated the suitability of the approach as in-system
diagnostic tool.
Idioma:
Inglês
Tipo (Avaliação Docente):
Científica
Notas:
http://paginas.fe.up.pt/~imstw07/downloads/IMSTW_GTW_07_program.pdf
ISBN:978-972-99181-2-4
Nº de páginas:
5
Tipo de Licença: