A Comparison of ADC Test Methods

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2000

Autores

Hélio Mendonca (Autor) FEUP; José Machado da Silva (Autor) FEUP; José Silva Matos (Autor) FEUP

Ata de Conferência Internacional

Título: Proceedings of DCIS'00 - XV Design of Circuits and Integrated Systems Conference

Páginas: 102-107

XV Design of Circuits and Integrated Systems Conference DCIS'00

Montpellier, França, 21 a 24 de Novembro de 2000

Outras Informações

Abstract (EN): In this paper a comparison of the three most common test methods used on dynamic ADC testing is presented. This comparison is centred on three main figures of merit: functional performance characterisation parameters provided by the method, test implementation requirements, as well as computational effort and final precision and accuracy. Results are presented which support the comparison being done and highlight the differences presented by the methods.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 6