A low-power oscillation based LNA BIST scheme

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2006

Autores

José Machado da Silva (Autor) FEUP

Ata de Conferência Internacional

Título: IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings

Páginas: 268-272

International Conference on Design and Test of Integrated Systems in Nanoscale Technology

Tunis, TUNISIA, SEP 05-07, 2006

Indexação

ISI Web of Knowledge - 5 Citações

Scopus - 5 Citações

INSPEC

Classificação Científica

FOS: Ciências da engenharia e tecnologias > Outras ciências da engenharia e tecnologias

CORDIS: Ciências Tecnológicas > Engenharia > Engenharia electrónica

Outras Informações

ID Authenticus: P-004-PWW

DOI: 10.1109/dtis.2006.1708655

Abstract (EN): Test stimuli generation and power consumption are two Issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier Into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynan-dc power supply current and the LNA's output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the Interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 5