A Test Methodology to Compute Typical LNA Characterization Parameters

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2004

Autores

Gabriel A. Pinho (Autor) FEUP; José Machado da Silva (Autor) FEUP; Hélio S. Mendonça (Autor) FEUP; José S. Matos (Autor) FEUP

Ata de Conferência Internacional

Título: Proceedings of XIX Conference on Design of Circuits and Integrated Systems

Páginas: 127-132

XIX Conference on Design of Circuits and Integrated Systems

Bordeaux, France, November 24-26, 2004

Outras Informações

Abstract (EN): In-circuit testing methodologies are required to tackle the evaluation of embedded radiofrequency circuits. In this paper alternative methods are proposed to compute typical Low Noise Amplifier characterization parameters. The three suggested methods allow calculating gain, 1dB compression and third-order intercept points, harmonic distortion, signal-to-noise ratio and noise figure of a LNA. Simulation results are presented as a proof of concept. Preliminary experimental results are shown, and a test infrastructure is proposed to implement these methods in an RF receiver.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 6