A characterization of titanium anodic oxides by X-ray absorption spectroscopy and grazing X-ray diffraction

• Tipo: Artigo em Revista Científica Internacional
• Data: 1995

Autores

C. Fonseca (Autor) Outra; Traverse, A (Autor) Outra; Tadjeddine, A (Autor) Outra; Belo, MdC (Autor) Outra

Revista

A Revista está pendente de validação pelos Serviços Administrativos.

Título: JOURNAL OF ELECTROANALYTICAL CHEMISTRY

Vol. 388

Páginas: 115-122

ISSN: 0022-0728

Indexação

Scopus - 29 Citações

Outras Informações

ID Authenticus: P-00P-ZD0

Abstract (EN): Thin oxide layers obtained by electrochemical oxidation of titanium were studied using grazing X-ray diffraction (GXRD) and X-ray absorption spectroscopy (XAS). In the precursor state the layers, with thicknesses ranging from 15 to 105 nm, appeared to be amorphous by GXRD whereas a short-range order is detected via XAS with a first O shell and a second Ti shell, rather similar to those of crystallized anatase. Subsequent treatments of the layers such as aging under polarization or thermal annealing led to ordering on a larger scale and to crystallization in the anatase form. © 1995.

Idioma: Inglês

Tipo (Avaliação Docente): Científica