Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 1996

Autores

José Machado da Silva (Autor) FEUP; José Silva Matos (Autor) FEUP

Ata de Conferência Internacional

Título: EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS

Páginas: 264-269

European Design and Test Conference

PARIS, FRANCE, MAR 11-14, 1996

Indexação

Scopus - 0 Citações

Outras Informações

ID Authenticus: P-00J-XMX

DOI: 10.1109/EDTC.1996.494159

Abstract (EN): The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. © 1996 IEEE.

Idioma: Inglês

Tipo (Avaliação Docente): Científica