A method for the in-circuit testing of ¿¿ modulators

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2001

Autores

José Machado da Silva (Autor) FEUP; Duarte, JS (Autor) Outra; Matos, JS (Autor) Outra

Ata de Conferência Internacional

Título: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001

Páginas: 634-637

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001

13 September 2001 through 14 September 2001

Indexação

Scopus - 0 Citações

Outras Informações

ID Authenticus: P-00G-Q0S

Abstract (EN): A method for characterizing modulators is described which can be built in large integrated circuits or systems-on-chip. The method can be used to measure gain and phase, as well as, total harmonic distortion and signal to noise and harmonic distortion ratio parameters. It is prone to be built in circuit, when computational resources such as digital signal processors or re-programmable logic are available, but can also be used in computer simulations making it easier to compare expected with measured performances.

Idioma: Inglês

Tipo (Avaliação Docente): Científica