ADC testing using joint time-frequency analysis

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 1999

Autores

Helio Mendonca (Autor) FEUP; José Machado da Silva (Autor) FEUP; José Silva Matos (Autor) FEUP

Ata de Conferência Internacional

Título: THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS

Páginas: 157-159

3rd International Conference on Advanced A/D and D/A Conversion Techniques and their Applications

GLASGOW, SCOTLAND, JUL 27-28, 1999

Indexação

ISI Web of Knowledge - 2 Citações

Scopus - 1 Citação

Outras Informações

ID Authenticus: P-007-8RT

DOI: 10.1049/cp:19990486

Abstract (EN): An account is given on the joint time-frequency analysis (JTFA) and the short time-frequency transform algorithm in particular as an alternative technique for dynamic testing of analog to digital converters (ADCs). It is shown that this technique can lead to a significant improvement in ADC testing mainly due the possibility of using non-stationary signals allowing a more rapid test capable of analyzing even localized features.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 3