Polarization-dependent Raman spectra of heteroepitaxial (Ba,Sr)TiO3/MgO thin films

• Tipo: Artigo em Revista Científica Internacional
• Data: 2002

Autores

Yuzyuk, YI (Autor) Outra; Alyoshin, VA (Autor) Outra; Zakharchenko, IN (Autor) Outra; Sviridov, EV (Autor) Outra; Almeida, A (Autor) FCUP; Chaves, MR (Autor) FCUP

Revista

Título: Physical Review B

Vol. 65

Páginas: 1341071-1341079

ISSN: 2469-9950

Editora: American Physical Society

Indexação

ISI Web of Knowledge - 44 Citações

Scopus - 46 Citações

Outras Informações

ID Authenticus: P-000-PYH

DOI: 10.1103/physrevb.65.134107

Abstract (EN): We have studied the concentration dependence of the Raman spectra of heteroepitaxial (Ba1-xSrx)TiO3 (BST) (x=0, 0.15, 0.30, and 0.45) thin films deposited by rf sputtering on (001) MgO substrates. It is found that substitution of Ba by Sr leads to the distortions of the Ti-O bonds and causes the appearance of new bands in the Raman spectra near the bands corresponding to the Ti-O vibrations. The Sr incorporation induces relatively large shifts of the low-frequency Raman peaks attributed to E-TO and A(1 TO) components of the soft mode. The E-TO soft mode in BST films becomes underdamped for xgreater than or equal to0.3 and is very sensitive to the two-dimensional compressive stresses.

Idioma: Inglês

Tipo (Avaliação Docente): Científica

Nº de páginas: 9