Automatic software fault localization using generic program invariants

• Tipo: Artigo em Livro de Atas de Conferência Internacional
• Data: 2008

Autores

Abreu, R (Autor) Outra; Gonzalez, A (Autor) Outra; Zoeteweij, P (Autor) Outra; Van Gemund, AJC (Autor) Outra

Ata de Conferência Internacional

Título: APPLIED COMPUTING 2008, VOLS 1-3

Páginas: 712-717

23rd Annual ACM Symposium on Applied Computing

Fortaleza, BRAZIL, MAR 16-20, 2008

Indexação

ISI Proceedings

Scopus - 28 Citações

Classificação Científica

CORDIS: Ciências Tecnológicas > Engenharia > Engenharia de computadores

Outras Informações

ID Authenticus: P-008-PDD

DOI: 10.1145/1363686.1363855

Abstract (EN): Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of low-cost, generic invariants ("screeners" ) in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bitmask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14% screener execution time overhead, but this overhead can be reduced at limited performance penalty. Copyright 2008 ACM.

Idioma: Inglês

Tipo (Avaliação Docente): Científica