Adding Fast Parity Check to BST for Concurrent Monitoring

• Type: Article in International Conference Proceedings Book
• Date: 1999

Authors

J. Santos (Author) Other; José Martins Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the European Test Workshop ETW'99

European Test Workshop ETW'99

Konstanz, Alemanha, 25 a 28 de Maio de 1999

Scientific classification

CORDIS: Technological sciences > Engineering > Electrical engineering

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

Abstract (EN): Recent proposals rely on data scanned through BST in several applications, namely to provide on-line decisions inside dependable ICs. This means the need to have confidence in the string entering the target IC. Our proposal is to allow the on-board BST controller to have access to the parity of this data immediately after the scan operation. With a minor enhancement to the TAP controller, in case of error the scan operation can be repeated immediately.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 1