Coherent Fringe Projector for 3d surface profilometry - art. no. 66160X

• Type: Article in International Conference Proceedings Book
• Date: 2007

Authors

Tavares, P (Author) Other; Viriato, N (Author) Other; Reis, J (Author) Other; Mário Vaz (Author) FEUP

Conference proceedings International

Title: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2

Pages: X6160-X6160

Conference on Optical Measurement Systems for Industrial Inspection V

Munich, GERMANY, JUN 18-22, 2007

Indexing

ISI Web of Knowledge - 0 Citations

Scopus - 0 Citations

Other information

Authenticus ID: P-004-E4E

DOI: 10.1117/12.726031

Abstract (EN): Active image processing full field methods for 3D contactless profilometry are amongst the current methods of choice for obtaining point clouds from object surfaces. The fringe projection system plays a decisive role on the entire process, significantly impacting both quality and reliability of the final measurements. Moreover, most every phase measurement profilometer can only be used under laboratory controlled lighting environments. This note describes the ongoing LOME project for a coherent fringe projection system which will enable outdoor measurements by selectively band pass filtering the projected wavelength.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 9