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OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2

Title

Type

International Conference Proceedings Book

Date

2007

Title

OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2

Type

International Conference Proceedings Book

Year

2007

Conference International

Conference on Optical Measurement Systems for Industrial Inspection V

Munich, GERMANY, JUN 18-22, 2007

Other information

Language: English

Type (Professor's evaluation): Scientific

ISBN: 978-0-8194-6758-4

Collection: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)

Vol.: 6616

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Publications included

Article in International Conference Proceedings Book

Tavares, P (Author) (Other); Viriato, N (Author) (Other); Reis, J (Author) (Other); Mário Vaz (Author) (FEUP)

2007