A processor for testing mixed-signal cores in System-on-Chip

• Type: Article in International Conference Proceedings Book
• Date: 2005

Authors

Duarte, F (Author) Other; José Machado da Silva (Author) FEUP; José Carlos Alves (Author) FEUP; Pinho, GA (Author) Other; José Silva Matos (Author) FEUP

Conference proceedings International

Title: DSD 2005: 8th Euromicro Conference on Digital System Design, Proceedings

Pages: 184-191

8th Euromicro Conference on Digital System Design

Oporto, PORTUGAL, AUG 30-SEP 03, 2005

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Other information

Authenticus ID: P-000-5JP

DOI: 10.1109/DSD.2005.11

Abstract (EN): This paper describes the design of a processor specific for testing cores embedded in system-on-chip. This processor which can be implemented within a system's reconfigurable area, shall be responsible for scheduling and control test operations and perform preliminary data processing, as well as to provide the interface with an external tester Building these test operations on-chip allows for simplifying external tester interface and to reduce testing time. The testing procedure and the infrastructure required to test an AID converter is described as an example.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 8