Narrow optical gap ferroelectric Bi2ZnTiO6 thin films deposited by RF sputtering

• Type: Article in International Scientific Journal
• Date: 2019-03-22

Authors

Fábio Figueiras (Author) FCUP

Journal

Title: Journal of Materials Chemistry A

Vol. 7

ISSN: 2050-7488

Publisher: Royal Society of Chemistry

Indexing

ISI Web of Knowledge - 7 Citations

Scopus - 7 Citations

Other information

Authenticus ID: P-00Q-GYW

DOI: 10.1039/c8ta09425j

Abstract (EN): This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF- sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic generation. A narrow indirect optical gap of 1.48 eV was measured using optical diffuse reflectance. The ferroelectric domain reversal was further demonstrated through piezo-response force microscopy. This work demonstrates a practical method to fabricate the BZT perovskite phase, without resorting to high pressure and temperature conditions necessary to synthetize the bulk form, with outstanding optical and ferroelectric properties.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6