Abstract (EN):
The development of a mixed-signal test bus infrastructure - IEEE P1149.4 - is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros.
Language:
English
Type (Professor's evaluation):
Scientific
No. of pages:
9