Using the BS register for capturing and storing n-bit sequences in real-time

• Type: Article in International Conference Proceedings Book
• Date: 1999

Authors

Gustavo R. Alves (Author) Other; J. M. Martins Ferreira (Author) FEUP

Conference proceedings International

Title: Proceedings of the European Test Workshop ETW'99

Pages: 1-6

European Test Workshop ETW'99

Konstanz, Alemanha, 25 a 28 de Maio de 1999

Indexing

Scopus

INSPEC

Scientific classification

CORDIS: Technological sciences > Engineering > Electrical engineering

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

Other information

DOI: 10.1109/ETW.1999.804501

Abstract (EN): Boundary Scan Test is now widely accepted and used for the structural test of Printed Circuit Boards. However, the more demanding requirements of prototype debug and validation are not sufficiently covered by the mandatory and optional operating modes described in the IEEE 1149.1 Standard. Previous work has focused on this problem, having resulted in a new set of user-defined optional instructions addressing the use of the BS register to store in real-time a sequence of contiguous vectors, captured at its parallel inputs without / until / after a certain condition is found. In this paper we describe the tradeoff between input channels and storage capacity, by proposing a new operating mode where the BS register is used to capture / store an n-bit sequence captured at one single functional pin. We also describe how this operating mode can be further extended into the P1149.4 domain, for capturing / storing the n-bit data stream generated by a sigma-delta converter placed in the TBIC.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6