Go to:
Logótipo
Comuta visibilidade da coluna esquerda
Você está em: Start > Publications > View > Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)
Publication

Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)

Title
Proceedings of the 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 06)
Type
International Conference Proceedings Book
Year
2006
Conference International
21st IEEE International Symposium on Defect. and Fault Tolerance in VLSI Systems (DFT 06)
Arlington/Washington DC, EUA, 4 a 6 de Outubro de 2006
Scientific classification
FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering
Other information
Language: English
Type (Professor's evaluation): Scientific
ISBN: 0-7695-2706-X
Documents
We could not find any documents associated to the publication.
Publications included
Real time fault injection using enhanced OCD - a performance analysis
Article in International Conference Proceedings Book
André V. Fidalgo (Author) (Other); Gustavo R. Alves (Author) (Other); José M. Ferreira (Author) (FEUP)
Recommend this page Top
Copyright 1996-2025 © Centro de Desporto da Universidade do Porto I Terms and Conditions I Acessibility I Index A-Z
Page created on: 2025-12-22 07:05:36 | Privacy Policy | Personal Data Protection Policy | Whistleblowing | Electronic Yellow Book