Dynamic Characterization of Analogue-to-Digital Converters

• Type: Book
• Date: 2005

Authors

Dominique Dallet (Editor) Other; José Machado da Silva (Editor) FEUP

Publisher

Springer

Cham

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences

Other information

DOI: 10.1007/b136458

Abstract (EN): ADCs are, eventually, the most pervasive analogue blocks in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architectures and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. At present, most of the signal processing performed in electronic systems is becoming digital, and the role of the ADCs placed at the borders of the digital domain acquires a particular relevance, since the signal degradation introduced by these components cannot normally be recovered by subsequent processing. Both the markets of stand-alone ADCs and of ADC macrocells to be embedded in complex systems-on-chip, benefit from the availability of performance parameters accurately describing their expected behaviour, and of clearly specified test methods to be used for their measurement. This book is structured in two main parts. Part one comprises chapters one to six. The first one provides an overview of the most important ADCs' architectures and respective fields of application. An introduction to the most relevant nomenclature and definitions of terms is also presented. Chapter two describes the generic architecture of an ADC test setup, and guidelines and best practice procedures are proposed in order to guarantee reliable test results. Chapters 3, 4, and 5 are devoted to the description of dynamic test techniques using sinewaves, respectively, sinewave fitting (time domain data analysis), discrete Fourier transform (frequency domain analysis), and code histogram test (statistical domain analysis). These techniques are thoroughly described, as well as the fundamental mathematical background behind the equations to be used to obtain ADCs' characterization parameters provided in each case. A comparison among these three methods is presented in chapter 6. The objective is not to find the best or the worst methods, but mainly to compare how they behave when test conditions are not ideal and to identify their requirements in terms of test time and volume of data. Examples of ATE implementation are also included. The second part comprises chapters 7 to 10, which provide additional information to test for other relevant parameters, such as jitter, differential gain and phase, step and transient response, and hysteresis.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 280

ISBN: 978-0-387-25903-1

Collection: The International Series in Engineering and Computer Science

Vol.: 860