ADC testing using joint time-frequency analysis

• Type: Article in International Scientific Journal
• Date: 2001

Authors

José Alfredo Ribeiro da Silva Matos (Author) FEUP; José Alberto Peixoto Machado da Silva (Author) FEUP; Hélio Mendes de Sousa Mendonca (Author) FEUP

Journal

Title: Computer Standards & Interfaces

Vol. 23 No. 2

Pages: 129-135

ISSN: 0920-5489

Publisher: Elsevier

Indexing

ISI Web of Knowledge - 1 Citation

Scopus - 1 Citation

Scientific classification

FOS: Engineering and technology > Electrical engineering, Electronic engineering, Information engineering

CORDIS: Technological sciences > Engineering > Electronic engineering

Other information

Authenticus ID: P-000-VKY

DOI: 10.1016/s0920-5489(01)00067-8

Resumo (PT): É proposta a utilização da transformada conjunta tempo-frequência no teste de conversores A/D. É mostrado como pode ser cracterizado o conversor na gama de frequências estabelecida com recurso a uma única operação de teste.

Abstract (EN): Analog-to-digital converter (ADC) characterization is usually performed using stationary stimuli like sine waves. However, the use of a non-stationary stimulus, besides providing testing conditions closer to those found in real applications, can lead to interesting improvements in ADC testing speed, This kind of signal needs proper processing techniques in order to extract useful information. In this paper we propose the use of joint time-frequency analysis (JTFA) for this purpose. The basic principles of the technique, and how it can be used in ADC testing are presented. in particular, a method for characterising an ADC on its entire bandwidth using a single stimulus is described.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 7