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The Bi-O edge sensor: from theory to practice

Title
The Bi-O edge sensor: from theory to practice
Type
Article in International Conference Proceedings Book
Year
2024
Authors
Vérinaud, C
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Héritier, CT
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Kasper, M
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Haffert, S
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Snik, F
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Doelman, D
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Carlotti, A
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Engler, B
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Le Louarn, M
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Correia, C
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Tallon, M
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Conference proceedings International
Conference on Adaptive Optics Systems IX
Yokohama, JAPAN, JUN 16-22, 2024
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Authenticus ID: P-017-96W
Abstract (EN): Resolution and sensitivity of the wavefront sensor (WFS) are key requirements for eXtreme Adaptive Optics (XAO) applications. We present a new class of WFSs, the Bi-Orthogonal Foucault-knife-edge (Bi-O edge), that is directly inspired by the Foucault knife-edge test. The idea consists of using a beam-splitter producing two foci, each of which is sensed by an edge with an orthogonal direction to the other. We describe two implementation concepts. The first one, the tip-tilt modulated sharp Bi-O-edge, can be seen as a mild evolution of the Pyramid. The second one uses a smooth, gradual amplitude mask over a 'grey' zone on the edge (grey Bi-O edge). We analyze the increased gain in sensitivity and the super-resolution capability, we compare these properties to the Pyramid sensor and produce end-to-end simulations. An important advantage of the grey Bi-O edge is the static modulation which is well adapted for fast XAO systems. The grey edge consists of a rectangular zone on the edge of the same size as the modulation circle. We will discuss the manufacturability of loss-less grey Foucault-knife edges, and we develop a polarization-based technique for the Bi-O edge prototype for the ESO GHOST test bench.
Language: English
Type (Professor's evaluation): Scientific
No. of pages: 15
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