Optical properties of PZT 65/35 thin films deposited by sol-gel

• Type: Article in International Scientific Journal
• Date: 2002

Authors

Boerasu, I (Author) Other; Vasilevskiy, MI (Author) Other; Pereira, M (Author) Other; Costa, MF (Author) Other; Gomes, MJM (Author) Other

Journal

Title: Ferroelectrics

Vol. 268

Pages: 187-192

ISSN: 0015-0193

Publisher: Taylor & Francis

Indexing

ISI Web of Knowledge - 16 Citations

Scopus - 17 Citations

Other information

Authenticus ID: P-000-R5K

DOI: 10.1080/00150190211063

Abstract (EN): PZT 65/35 thin films were deposited on Pt-coated Si (100) and MgO (110) substrates using the sol-gel technique. The crystalline structure of the films was investigated by X-ray diffraction and Raman spectroscopy. Results of measurements and modeling of the optical spectra for the PZT films on MgO substrates are reported. The effective dielectric function is calculated versus frequency and Gaussian tail of the join density of states under the assumption of direct band to band transition.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6