Preparation and optical characterization of lanthanum modified lead zirconate titanate thin films on indium-doped tin oxide-coated glass substrate

• Type: Article in International Scientific Journal
• Date: 2006

Authors

Khodorov, A (Author) Other; Gomes, MJM (Author) Other

Journal

Title: Thin Solid Films

Vol. 515

Pages: 1782-1787

ISSN: 0040-6090

Publisher: Elsevier

Indexing

ISI Web of Knowledge - 10 Citations

Scopus - 12 Citations

Other information

Authenticus ID: P-004-FHQ

DOI: 10.1016/j.tsf.2006.06.038

Abstract (EN): Lanthanum modified lead zirconate titanate (PLZT) thin films were fabricated on indium-doped tin oxide (ITO)-coated glass substrate by sol-gel method. The structure of the films was characterized with X-ray diffraction and scanning electron microscopy. The optical properties were investigated in the wavelength range of 220-2400 nm. The sample was modelled as a three layer structure on finite substrate, and optical constants of this system were calculated from the transmission and reflection spectra. The calculated dielectric function was fitted with the Drude model in the case of ITO and a sum of Lorentzian oscillators in the case of PUT films. For PUT film the anomalous behaviour of imaginary part of dielectric function was observed below the absorption edge. The possible reasons of that behaviour were discussed.

Language: English

Type (Professor's evaluation): Scientific

No. of pages: 6