Abstract (EN):
An electronic calibration technique for
capacitive MEMS accelerometers based on the
measurement of pull-in voltages is described. A
combination of pull-in voltages and resonance frequency
measurements can be used for the estimation of processinduced
variations in device dimensions from layout and
deviations in material properties from nominal value,
which enables auto-calibration. Measurements on
fabricated devices confirm the validity of the proposed
technique and electronic calibration is experimentally
demonstrated.
Language:
English
Type (Professor's evaluation):
Scientific
No. of pages:
4
License type: